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Published in 2017 at "Journal of Nanoparticle Research"
DOI: 10.1007/s11051-017-3838-2
Abstract: Patents are an essential information source used to monitor, track, and analyze nanotechnology. When it comes to search nanotechnology-related patents, a keyword search is often incomplete and struggles to cover such an interdisciplinary discipline. Patent…
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Keywords:
patent classification;
classification schemes;
monitoring nanotechnology;
nanotechnology ... See more keywords
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Published in 2018 at "Scientometrics"
DOI: 10.1007/s11192-018-2905-5
Abstract: Patent classification is an essential task in patent information management and patent knowledge mining. However, this task is still largely done manually due to the unsatisfactory performance of current algorithms. Recently, deep learning methods such…
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Keywords:
classification;
neural networks;
word;
patent classification ... See more keywords
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Published in 2017 at "Technological Forecasting and Social Change"
DOI: 10.1016/j.techfore.2017.02.018
Abstract: Technology opportunity discovery (TOD), customized to a firm's current technology capability, can be a good starting point to formulate a technology strategy for a firm that lacks technology information, experts, and/or facilities. Although patent-based studies…
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Keywords:
collaborative filtering;
firm;
patent classification;
technology ... See more keywords
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Published in 2019 at "World Patent Information"
DOI: 10.1016/j.wpi.2019.03.002
Abstract: Abstract In this study, we proposed combined kernel-based methods to leverage patent citation graph performance for patent classification. The concept is to use the combined graph kernels of the citation graph to classify patent documents,…
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Keywords:
combined graph;
patent classification;
graph kernels;
patent ... See more keywords
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Published in 2020 at "World Patent Information"
DOI: 10.1016/j.wpi.2020.101968
Abstract: Abstract I present an analysis of feature selection for automatic patent categorization. For a corpus of 7,309 patent applications from the World Patent Information (WPI) Test Collection (Lupu, 2019), I assign International Patent Classification (IPC)…
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Keywords:
automatic patent;
parameter tuning;
patent classification;
patent ... See more keywords