Articles with "path delay" as a keyword



Efficient interpolation based OMP for sparse channel estimation in underwater acoustic OFDM

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Published in 2021 at "Applied Acoustics"

DOI: 10.1016/j.apacoust.2020.107606

Abstract: Abstract To achieve higher accuracy of path delay estimation with lower computational complexity, the orthogonal matching pursuit (OMP) method with interpolation algorithm has been adopted for the sparse channel estimation, such as underwater acoustic (UWA)… read more here.

Keywords: based omp; interpolation based; estimation; path delay ... See more keywords

Weak and Strong Non-Robust Tests for Functionally Possible Path Delay Faults

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Published in 2024 at "IEEE Access"

DOI: 10.1109/access.2024.3486057

Abstract: Small delay defects are caused by fabrication imperfections as well as chip aging, and detected by tests for path delay faults. Path delay faults that can cause failures during functional operation are especially important to… read more here.

Keywords: strong non; delay faults; non robust; path delay ... See more keywords

Functionally-Possible Subcircuit-Based Tests for Path Delay Faults

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Published in 2025 at "IEEE Access"

DOI: 10.1109/access.2025.3539981

Abstract: Advanced chip fabrication technologies are susceptible to defects of various types, including small delay defects that are modeled by path delay faults. Structural (scan-based) tests targeting the detection of hardware defects use scan chains to… read more here.

Keywords: delay faults; path delay; scan based; based tests ... See more keywords

Path Unselection for Path Delay Fault Test Generation

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Published in 2023 at "IEEE Transactions on Very Large Scale Integration (VLSI) Systems"

DOI: 10.1109/tvlsi.2022.3224361

Abstract: Path selection procedures identify path delay faults whose tests detect small delay defects. Path selection criteria are positive in the sense that they point to paths that should be selected, e.g., the longest paths. However,… read more here.

Keywords: procedure; test generation; delay faults; path ... See more keywords

Statistical Sequential Path Delay Variation Model with Lognormal Distribution for Low-Voltage Circuit

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Published in 2025 at "Applied Sciences"

DOI: 10.3390/app152312560

Abstract: To solve the timing uncertainty in low-voltage circuits, this paper proposes an analytical sequential path delay model based on the lognormal distribution. Unlike previous works that primarily focus on combinational logic, our model provides a… read more here.

Keywords: lognormal distribution; path delay; low voltage; sequential path ... See more keywords