Residual-based pattern center calibration in high-resolution electron backscatter diffraction.
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DOI: 10.1016/j.micron.2021.103081
Abstract: High resolution electron backscatter diffraction is an emerging technique of micro-structural characterization which can be used for local elastic strain measurement. Pattern center (PC) coordinate, an important parameter which affects accuracy of HR-EBSD, should be… read more here.
Keywords: high resolution; resolution electron; diffraction; backscatter diffraction ... See more keywords