Nanoscale Pattern Decay Monitored Line-by-Line via in-situ Heated AFM.
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DOI: 10.1021/acsami.0c01807
Abstract: We combine in-situ heated atomic force microscopy (AFM) with automated line-by-line spectral analysis to quantify the relaxation or decay phenomenon of nanopatterned composite polymer films above the glass transition temperature of the composite material. This… read more here.
Keywords: line; line line; pattern decay; situ ... See more keywords