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Published in 2019 at "Scientific Reports"
DOI: 10.1038/s41598-019-53949-x
Abstract: We demonstrate the growth of low density anti-phase boundaries, crack-free GaAs epilayers, by Molecular Beam Epitaxy on silicon (001) substrates. The method relies on the deposition of thick GaAs on a suspended Ge buffer realized…
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Keywords:
grown patterned;
gaas epilayers;
epilayers grown;
001 silicon ... See more keywords