Peak position differences observed during XPS sputter depth profiling of the SEI on lithiated and delithiated carbon-based anode material for Li-ion batteries
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DOI: 10.1016/j.apsusc.2016.12.223
Abstract: Abstract The ability of delivering chemical information from peak shift phenomena has ever since made X-ray photoelectron spectroscopy (XPS) an ideal tool for material characterization in Li-ion batteries (LIB). Upon investigation, charging is inevitable as… read more here.
Keywords: depth profiling; ion; ion batteries; sputter depth ... See more keywords