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Published in 2019 at "Materials Science in Semiconductor Processing"
DOI: 10.1016/j.mssp.2019.05.010
Abstract: Abstract We study the effect of plasma-enhanced chemical vapor deposition (PECVD) SiNx process to atomic layer deposited (ALD) Al2O3 films on crystalline silicon surface passivation. The plasma-induced damage on Al2O3 films is affected by the…
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Keywords:
plasma induced;
pecvd sinx;
ald al2o3;
al2o3 films ... See more keywords
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Published in 2017 at "IEEE Transactions on Terahertz Science and Technology"
DOI: 10.1109/tthz.2017.2759507
Abstract: We present a performance analysis of passive THz components based on Microstrip transmission lines with a 2-μm-thin plasma-enhanced chemical vapor deposition grown silicon nitride (PECVD SiNx) dielectric layer. A set of thru-reflect-line calibration structures is…
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Keywords:
thz components;
components based;
technology;
pecvd sinx ... See more keywords