Semiconductor behavior of pentagonal silver nanowires measured under mechanical deformation
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DOI: 10.1007/s11051-019-4577-3
Abstract: In the present work, electrical measurements using in situ transmission electron microscopy (TEM) on pentagonal silver nanowires were performed. Electrical biasing was applied to individual nanowires with and without simultaneous in situ TEM mechanical deformation.… read more here.
Keywords: semiconductor behavior; deformation; silver nanowires; pentagonal silver ... See more keywords