The Effect of Number of Fins per Transistor on the TID Response of 12LP FinFET Technology
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DOI: 10.1109/tns.2025.3589259
Abstract: This article presents an analysis of the total ionizing dose (TID) response of n-channel transistors in the 12LP fin-based field effect transistor (FinFET) technology, with a focus on the impact of fin count per transistor.… read more here.
Keywords: number fins; per transistor; tid response; response ... See more keywords