Visualizing period fluctuations in strained-layer superlattices with scanning tunneling microscopy
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DOI: 10.1063/1.5008865
Abstract: We show how cross-sectional scanning tunneling microscopy (STM) may be used to accurately map the period fluctuations throughout epitaxial, strained-layer superlattices based on the InAs/InAsSb and InGaAs/InAlAs material systems. The concept, analogous to Bragg's law… read more here.
Keywords: tunneling microscopy; microscopy; period; strained layer ... See more keywords