Thin film structural analysis using variable-period x-ray standing waves
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DOI: 10.1103/physrevb.98.165402
Abstract: Variable-period x-ray standing wave (VPXSW) studies have been carried out using 3 keV x rays and photoelectron detection. Two model surfaces have been used, a native SiO2 layer (20 A thick) on bulk silicon, and… read more here.
Keywords: variable period; layer; ray standing; ray ... See more keywords