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Published in 2020 at "Journal of Vacuum Science and Technology"
DOI: 10.1116/6.0000408
Abstract: Investigation of the microstructure and phase analysis of the periodic Mo/Si and Mo/Be multilayers are essential for depositing high reflective multilayers that operate at soft x-ray to extreme ultraviolet radiations. Raman spectroscopy revealed the presence…
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Keywords:
raman scattering;
phase;
periodic multilayers;
study nanoscale ... See more keywords