Principle and applications of peak force infrared microscopy.
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DOI: 10.1039/d2cs00096b
Abstract: Peak force infrared (PFIR) microscopy is an emerging atomic force microscopy (AFM)-based infrared microscopy that bypasses Abbe's diffraction limit on spatial resolution. The PFIR microscopy utilizes a nanoscopically sharp AFM tip to mechanically detect the… read more here.
Keywords: pfir microscopy; force infrared; peak force; microscopy ... See more keywords