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Published in 2023 at "Microscopy and Microanalysis"
DOI: 10.1093/micmic/ozad052
Abstract: Multislice simulations of 4D scanning transmission electron microscopy (4D STEM) data are computationally demanding due to the large number of STEM probe positions that must be calculated. For accurate analysis, inelastic scattering from phonons and…
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Keywords:
phonon plasmon;
phase scrambling;
microscopy;
phase ... See more keywords