Surface optical characterization at nanoscale using phasor representation of data acquired by scattering scanning near-field optical microscopy
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DOI: 10.1016/j.apsusc.2020.145347
Abstract: Abstract Placed at the junction of laser-scanning and probe-scanning techniques, scattering scanning near-field optical microscopy (s-SNOM) is a promising tool for the optical investigation of surfaces at nanoscale resolution. In this work we expand the… read more here.
Keywords: scattering scanning; microscopy; snom; phasor representation ... See more keywords