Improved Ray Tracing on Random Pyramid Texture via Application of Phong Scattering
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DOI: 10.1109/jphotov.2019.2894688
Abstract: This paper presents an experimental investigation into the light trapping within silicon wafers textured by upright random pyramids. In prior studies, the conventional approach to simulating random pyramids agrees poorly with experimental data at wavelengths… read more here.
Keywords: tracing random; ray tracing; random; random pyramids ... See more keywords