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Published in 2018 at "Ferroelectrics"
DOI: 10.1080/00150193.2018.1499407
Abstract: Abstract Recently we have demonstrated that out-of-plane dielectric properties of polycrystalline SrTiO3 (ST) films depend on the strain/stress induced by the substrates due to thermal expansion misfit. Here, we present a complementary infra-red (IR) spectroscopy…
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Keywords:
thin films;
polar phonons;
polycrystalline srtio3;
phonons polycrystalline ... See more keywords