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Published in 2022 at "Materials"
DOI: 10.3390/ma15051899
Abstract: Flexible indium tin oxide (ITO)/Y2O3/Ag resistive random access memory (RRAM) devices were successfully fabricated using a thermal-energy-free ultraviolet (UV)/ozone-assisted photochemical annealing process. Using the UV/ozone-assisted photochemical process, the organic residue can be eliminated, and thinner…
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Keywords:
rram devices;
ozone assisted;
photochemical annealing;
assisted photochemical ... See more keywords