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Published in 2022 at "Journal of the American Chemical Society"
DOI: 10.1021/jacs.2c08202
Abstract: The resolution, line edge roughness, and sensitivity (RLS) trade-off has fundamentally limited the lithographic performance of chemically amplified resists. Production of next-generation transistors using extreme ultraviolet (EUV) lithography depends on a solution to this problem.…
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Keywords:
self immolative;
phthalaldehyde derivatives;
photoacid generator;
next generation ... See more keywords