Automatic etch pit density analysis in multicrystalline silicon
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DOI: 10.1016/j.commatsci.2020.109886
Abstract: Abstract This publication contains a description and is published in combination with the source code for a tool capable of determining the etch pit density (EPD) on multicrystalline silicon image data. The algorithm is capable… read more here.
Keywords: analysis; multicrystalline silicon; etch pit; pit density ... See more keywords