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Published in 2021 at "AIP Advances"
DOI: 10.1063/5.0033222
Abstract: A new plasma diagnostic tool called the planar cutoff probe (PCP), recently developed by Kim et al. [Plasma Sources Sci. Technol. 28, 015004(2019)], can be embedded into a chamber wall or wafer chuck electrode for…
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Keywords:
cutoff probe;
planar cutoff;
design;
probe ... See more keywords