New methodology to determine the loss tangent of dielectric planar samples by using electrically coupled resonators
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DOI: 10.1080/09205071.2020.1816502
Abstract: A new methodology to determine the loss tangent of dielectric planar samples by using electrically coupled resonators is presented. The coupling between the resonators is disrupted by the sample under test (SUT). The proposed methodology… read more here.
Keywords: loss tangent; methodology; planar samples;