Angular Sensitivity of Neutron-Induced Single-Event Upsets in 12-nm FinFET SRAMs With Comparison to 20-nm Planar SRAMs
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DOI: 10.1109/tns.2020.2989446
Abstract: The angular sensitivity of neutron-induced single-event upsets (SEUs) is studied in 12-nm FinFET SRAMs. Irradiation experiments are performed using a terrestrial environment-compatible source with varying incidence angles. The analyses of the occurrence rates of SEUs… read more here.
Keywords: angular sensitivity; finfet srams; planar srams; sensitivity neutron ... See more keywords