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Published in 2020 at "Journal of Alloys and Compounds"
DOI: 10.1016/j.jallcom.2020.156631
Abstract: Abstract A series of m-plane ZnO films grown on sapphire and Si substrates with different thicknesses (186–371 nm) and different annealing temperatures (150–200 °C) were studied in detail by comparing X-ray diffraction, photoluminescence and spectroscopic ellipsometry measurements.…
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Keywords:
ellipsometry;
temperature;
plane zno;
photoluminescence ... See more keywords
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Published in 2017 at "Optical Materials Express"
DOI: 10.1364/ome.7.003944
Abstract: Nonpolar a-plane ZnO layers with anisotropic in-plane strains were prepared on the three substrates of r-sapphire, a-GaN, and a-Al0.08GaN templates via a pulsed laser deposition system, to investigate the distinguishing anisotropic photoluminescence properties of a-ZnO…
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Keywords:
zno;
plane zno;
nonpolar plane;
photoluminescence ... See more keywords