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Published in 2019 at "Microelectronics Reliability"
DOI: 10.1016/j.microrel.2019.06.019
Abstract: Abstract A simple method for monitoring the switching activity (forming, set, reset events and stuck-at-0/1 faults) in memristive cross-point arrays with line resistance effects is proposed. The method consists in correlating incremental current changes in…
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Keywords:
simple method;
point arrays;
cross point;
method monitoring ... See more keywords