SPAR: A New Test-Point Insertion Using Shared Points for Area Overhead Reduction
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DOI: 10.1109/tcad.2022.3147100
Abstract: Test-point insertion (TPI) is an effective technique for improving the random pattern testability of digital circuits. However, it introduces area and performance overhead. Because the test-point area takes a significant portion of the test logic… read more here.
Keywords: test point; point insertion; area; shared point ... See more keywords