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Published in 2017 at "Scientific Reports"
DOI: 10.1038/s41598-017-18193-1
Abstract: A method to detect optical modes from vertical InGaAs nanowires (NWs) using cross-polarization microscopy is presented. Light scattered from the optical modes in the NWs is detected by filtering out the polarized direct reflection with…
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Keywords:
microscopy;
cross polarization;
using cross;
polarization microscopy ... See more keywords