A first passage based model for probabilistic fracture of polycrystalline silicon MEMS structures
Sign Up to like & getrecommendations! Published in 2017 at "Journal of The Mechanics and Physics of Solids"
DOI: 10.1016/j.jmps.2016.11.007
Abstract: Experiments have shown that the failure loads of Microelectromechanical Systems (MEMS) devices usually exhibit a considerable level of variability, which is believed to be caused by the random material strength and the geometry-induced random stress… read more here.
Keywords: strength; mems structures; poly mems; model ... See more keywords