Robust Optical-Levitation-Based Metrology of Nanoparticle's Position and Mass.
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DOI: 10.1103/physrevlett.124.223603
Abstract: Light has shown an incredible capability in precision measurement based on optomechanic interaction in high vacuum by isolating environment noises. However, there are still obstructions, such as displacement and mass estimation error, highly hampering the… read more here.
Keywords: mass; based metrology; optical levitation; position mass ... See more keywords