Functionally Possible Scan-Based Test Set as a Dual of a Compressed Multicycle Test Set
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DOI: 10.1109/tcad.2022.3193902
Abstract: Functionally possible scan-based tests create functional operation conditions during their functional capture cycles. This is important for avoiding failures that are caused by nonfunctional operation conditions rather than faults. However, the fault coverage achievable by… read more here.
Keywords: possible scan; test set; based test; test ... See more keywords