Potential Dip in Organic Photovoltaics Probed by Cross-sectional Kelvin Probe Force Microscopy
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DOI: 10.1186/s11671-018-2639-6
Abstract: Cross-sectional potential distribution of high open-circuit voltage bulk heterojunction photovoltaic device was measured using Kelvin probe force microscopy. Potential drop confined at cathode interface implies that photo-active layer is an effective p-type semiconductor. Potential values… read more here.
Keywords: cross sectional; probe force; microscopy; force microscopy ... See more keywords