In Situ Quantification of StrainâInduced Piezoelectric Potential of Dynamically Bending ZnO Microwires
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DOI: 10.1002/smtd.202201342
Abstract: The piezoelectric properties of semiconductor micro/nanowires (M/NWs) are crucial for optimizing semiconductorsâ electronic structure and carrier dynamics. However, the dynamic characterization of the piezoelectric properties of M/NWs remains challenging. Here, a Kelvin probe force microscopy… read more here.
Keywords: dynamically bending; potential dynamically; situ quantification; strain ... See more keywords