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Published in 2019 at "Microelectronics Reliability"
DOI: 10.1016/j.microrel.2019.113412
Abstract: Abstract This paper describes the design of a power-cycling test bench to study the reliability of power-GaN-HEMT power switches. The aim of the presented paper is to study the measurable electrical consequences of internal degradation…
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Keywords:
degradation;
power;
power cycling;
degradation indicators ... See more keywords
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Published in 2021 at "Microelectronics Reliability"
DOI: 10.1016/j.microrel.2021.114282
Abstract: Abstract A three-phase half-bridge insulated gate bipolar transistor (IGBT) module is designed and prototyped as the assembly of heat sink-substrate-post-chip-substrate-heat sink to realize high power density and good thermal performance for electric and hybrid electric…
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Keywords:
microscopy;
power cycling;
double side;
power ... See more keywords
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Published in 2021 at "Scientific reports"
DOI: 10.1038/s41598-021-84976-2
Abstract: Experimental investigations on the effects of load sequence on degradations of bond-wire contacts of Insulated Gate Bipolar Transistors power modules are reported in this paper. Both the junction temperature swing ([Formula: see text]) and the…
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Keywords:
see text;
formula see;
stress;
power cycling ... See more keywords
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Published in 2022 at "Medicine"
DOI: 10.1097/md.0000000000031841
Abstract: Background: Knee osteoarthritis (KOA) is a chronic musculoskeletal disease affecting the entire joint. Exercise therapy is the core treatment plan for non-surgical treatment of KOA, and tele-rehabilitation is also applied to KOA, but there is…
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Keywords:
function;
trial;
power cycling;
pain ... See more keywords
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Published in 2025 at "Proceedings of the Royal Society B: Biological Sciences"
DOI: 10.1098/rspb.2024.2649
Abstract: Using data recorded on ergocycle and in situ at the National Velodrome of Saint-Quentin-en-Yvelines, either during training sessions or during the 2022 World Championships, we first carry out an experimental study of the decay over…
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Keywords:
time;
power cycling;
effective time;
cycling sprinter ... See more keywords
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Published in 2024 at "IEEE Journal of Emerging and Selected Topics in Power Electronics"
DOI: 10.1109/jestpe.2024.3446968
Abstract: Power cycling tests are crucial for assessing the packaging-related reliability performance of power electronic components. This article presents a versatile test system designed for both dc and ac power cycling (ACPC), aimed at evaluating the…
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Keywords:
system;
power cycling;
test;
power electronic ... See more keywords
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Published in 2025 at "IEEE Journal of Emerging and Selected Topics in Power Electronics"
DOI: 10.1109/jestpe.2025.3532692
Abstract: Effective condition monitoring (CM) technology ensures the safe operation of insulated gate bipolar transistors (IGBTs). Most CM methods for IGBTs focus on extracting electrical, thermal, and magnetic parameters. Recent studies indicate that at the switching…
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Keywords:
degradation;
bonding wires;
power cycling;
power ... See more keywords
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Published in 2018 at "IEEE Transactions on Device and Materials Reliability"
DOI: 10.1109/tdmr.2018.2825386
Abstract: 13.5 mm ${\times }\,\,$ 13.5 mm sintered nano-silver attachments for power devices onto AlN substrates were prepared at 250 °C and a pressure of 10 MPa for 5 min and compared with Pb5Sn solder joint…
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Keywords:
sintered nano;
die attachments;
power;
power cycling ... See more keywords
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1
Published in 2019 at "IEEE Transactions on Power Electronics"
DOI: 10.1109/tpel.2019.2895695
Abstract: The study presented in this paper contributes to the quantification of the correlations between resistance degradation and Al metallization layer reconstruction observed in high-power insulated gate bipolar transistor (IGBT) modules during power cycling. The microstructure…
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Keywords:
metallization layer;
metallization;
power cycling;
resistance ... See more keywords
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Published in 2021 at "IEEE Transactions on Power Electronics"
DOI: 10.1109/tpel.2020.3018535
Abstract: One way to achieve the best in class reliability is the implementation of a design for reliability methodology into the design process in order to estimate the lifetime of each individual critical component, based on…
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Keywords:
methodology;
power cycling;
active power;
power ... See more keywords
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Published in 2025 at "IEEE Transactions on Power Electronics"
DOI: 10.1109/tpel.2025.3538565
Abstract: A proper lifetime model is beneficial to the reliability evaluation of power converters. In this article, a lifetime model for solder layer aging of power module is proposed, with thermal resistance growth rate as the…
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Keywords:
pulse duration;
cycling test;
power cycling;
power ... See more keywords