Sign Up to like & get
recommendations!
0
Published in 2017 at "IEEE Transactions on Electron Devices"
DOI: 10.1109/ted.2017.2684093
Abstract: Simulations of reverse breakdown behavior of GaN power diodes with junction termination extensions (JTEs) are presented. The p-type JTE is located at the edge of the main p-n-junction, and under reverse bias, the charge in…
read more here.
Keywords:
gan power;
junction termination;
power diodes;
jte ... See more keywords
Sign Up to like & get
recommendations!
0
Published in 2020 at "IEEE Transactions on Electron Devices"
DOI: 10.1109/ted.2020.2991397
Abstract: AlN devices have the potential to outperform current GaN devices, especially in the high-voltage region, thanks to AlN’s larger critical electric field and thermal conductivity. In order for the AlN-based power diodes to be realized…
read more here.
Keywords:
quality;
aln;
power diodes;
power ... See more keywords