Crystal Growth and Temperature Evolution of the Atomic Structure of Pr3Ga5SiO14 from the Langasite Family
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DOI: 10.1134/s1063774520020054
Abstract: Pr3Ga5SiO14 crystals from the langasite family have been grown by the floating zone melting technique. Their X-ray diffraction analysis is performed at 16 different temperatures in range of 94–293 K. An experiment with ultrahigh resolution… read more here.
Keywords: langasite family; temperature evolution; pr3ga5sio14; evolution atomic ... See more keywords