Applications of High Precision STEM Imaging to Structurally Complex Materials
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DOI: 10.1017/s143192761700277x
Abstract: Aberration corrected electron microscopy has made Ångstrom resolution imaging routine in labs across the world. One of the next frontiers is improving the quantitative reliability of data about materials we can extract from aberration-corrected images.… read more here.
Keywords: microscopy; high precision; precision stem; applications high ... See more keywords