Investigation of Preexisting and Generated Defects in Nonfilamentary a-Si/TiO2 RRAM and Their Impacts on RTN Amplitude Distribution
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DOI: 10.1109/ted.2018.2792221
Abstract: An extensive investigation of the preexisting and generated defects in amorphous-Si/TiO2-based nonfilamentary a-vacancy modulated conductive oxide RRAM devices has been carried out in this paper to identify the switching and degradation mechanisms, through a combination… read more here.
Keywords: preexisting generated; generated defects; rtn amplitude; investigation preexisting ... See more keywords