Hyperelastic Microcantilever AFM: Efficient Detection Mechanism Based on Principal Parametric Resonance
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DOI: 10.3390/nano12152598
Abstract: The impetus of writing this paper is to propose an efficient detection mechanism to scan the surface profile of a micro-sample using cantilever-based atomic force microscopy (AFM), operating in non-contact mode. In order to implement… read more here.
Keywords: parametric resonance; efficient detection; principal parametric; mechanism ... See more keywords