Redesigned Sensor Holder for an Atomic Force Microscope with an Adjustable Probe Direction
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DOI: 10.1007/s12541-021-00561-7
Abstract: The article presents a redesigned sensor holder for an atomic force microscope (AFM) with an adjustable probe direction, which is integrated into a nano measuring machine (NMM-1). The AFM, consisting of a commercial piezoresistive cantilever operated in… read more here.
Keywords: holder; probe direction; sensor holder; metrology ... See more keywords