Surface potential investigation on interdigitated back contact solar cells by Scanning Electron Microscopy and Kelvin Probe Force Microscopy: Effect of electrical bias
Sign Up to like & getrecommendations! Published in 2017 at "Solar Energy Materials and Solar Cells"
DOI: 10.1016/j.solmat.2016.12.009
Abstract: Abstract Both Kelvin Probe Force Microscopy and Scanning Electron Microscopy enable assessment of the effect of electrical bias on the surface potential of the layers of a solar cell. We report on a comprehensive comparison… read more here.
Keywords: probe force; microscopy; force microscopy; electron microscopy ... See more keywords
Multimodal Kelvin Probe Force Microscopy Investigations of a Photovoltaic WSe2/MoS2 Type-II Interface.
Sign Up to like & getrecommendations! Published in 2018 at "ACS applied materials & interfaces"
DOI: 10.1021/acsami.7b14616
Abstract: Atomically thin transition-metal dichalcogenides (TMDC) have become a new platform for the development of next-generation optoelectronic and light-harvesting devices. Here, we report a Kelvin probe force microscopy (KPFM) investigation carried out on a type-II photovoltaic… read more here.
Keywords: probe force; microscopy; type interface; force microscopy ... See more keywords
Comments on “Nanoscale Investigation of Carrier Lifetime on the Cross Section of Epitaxial Silicon Solar Cells Using Kelvin Probe Force Microscopy”
Sign Up to like & getrecommendations! Published in 2018 at "IEEE Journal of Photovoltaics"
DOI: 10.1109/jphotov.2018.2793760
Abstract: In recent years, there has been an increasing interest on the study of the complex interplay between the nanostructure and phototransport mechanism in many emerging photovoltaic technologies. Recently, Kelvin probe force microscopy has emerged as… read more here.
Keywords: probe force; microscopy; force microscopy; carrier lifetime ... See more keywords
Space charge measurements with Kelvin probe force microscopy
Sign Up to like & getrecommendations! Published in 2017 at "IEEE Transactions on Dielectrics and Electrical Insulation"
DOI: 10.1109/tdei.2017.006457
Abstract: The understanding of the complexity of the space charge formation and movement inside insulation materials demands a high resolution measurement technique. The Kelvin Probe Force Microscopy (KPFM) can fulfill this demand. The KPFM delivers the… read more here.
Keywords: probe force; space charge; space; microscopy ... See more keywords
Investigation of Optoelectronic Properties in Germanium Nanowire Integrated Silicon Substrate Using Kelvin Probe Force Microscopy
Sign Up to like & getrecommendations! Published in 2020 at "IEEE Transactions on Nanotechnology"
DOI: 10.1109/tnano.2020.3010691
Abstract: Catalyst free Germanium (Ge) nanowires (NW) and thin film (TF) have been synthesized by employing GLAD technique inside an electron-beam evaporator. X-ray diffraction patterns confirmed the successful growth of polycrystalline Ge-NW and Ge-TF. The FEG-SEM… read more here.
Keywords: microscopy; probe force; using kelvin; kelvin probe ... See more keywords
Potential Dip in Organic Photovoltaics Probed by Cross-sectional Kelvin Probe Force Microscopy
Sign Up to like & getrecommendations! Published in 2018 at "Nanoscale Research Letters"
DOI: 10.1186/s11671-018-2639-6
Abstract: Cross-sectional potential distribution of high open-circuit voltage bulk heterojunction photovoltaic device was measured using Kelvin probe force microscopy. Potential drop confined at cathode interface implies that photo-active layer is an effective p-type semiconductor. Potential values… read more here.
Keywords: cross sectional; probe force; microscopy; force microscopy ... See more keywords
Local VOC Measurements by Kelvin Probe Force Microscopy Applied on P-I-N Radial Junction Si Nanowires
Sign Up to like & getrecommendations! Published in 2019 at "Nanoscale Research Letters"
DOI: 10.1186/s11671-019-3230-5
Abstract: This work focuses on the extraction of the open circuit voltage (VOC) on photovoltaic nanowires by surface photovoltage (SPV) based on Kelvin probe force microscopy (KPFM) measurements. In a first approach, P-I-N radial junction (RJ)… read more here.
Keywords: voc; probe force; microscopy; radial junction ... See more keywords