Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Real mode
Sign Up to like & getrecommendations! Published in 2019 at "Applied Surface Science"
DOI: 10.1016/j.apsusc.2018.10.149
Abstract: A method is described intended for distributed calibration of a probe microscope scanner consisting in a search for a net of local calibration coefficients (LCCs) in the process of automatic measurement of a standard surface,… read more here.
Keywords: microscope scanner; probe microscope; distributed calibration; scanner ... See more keywords
Reel-to-Reel Scanning Hall Probe Microscope Measurement on REBCO Tapes
Sign Up to like & getrecommendations! Published in 2019 at "IEEE Transactions on Applied Superconductivity"
DOI: 10.1109/tasc.2019.2901989
Abstract: In the past two years, a reel-to-reel (R2R) scanning hall probe microscope (SHPM) measurement system has been developed and routinely used at the University of Houston for continuous and 100% testing of REBCO-coated conductors. The… read more here.
Keywords: scanning hall; hall probe; probe microscope; measurement ... See more keywords
In situ absolute magnetometry in an UHV scanning probe microscope using conducting polymer-thin film
Sign Up to like & getrecommendations! Published in 2017 at "Journal of Vacuum Science and Technology"
DOI: 10.1116/1.4973920
Abstract: The in situ measurement and control of the direction and magnitude of the magnetic field is demonstrated within the sample plane of a low-temperature ultra-high vacuum scanning probe microscope. These measurements utilized electrically detected magnetic… read more here.
Keywords: magnetometry; scanning probe; conducting polymer; probe microscope ... See more keywords
Designing a scanning probe microscope for in situ study of carbon materials growth processes during chemical vapor deposition
Sign Up to like & getrecommendations! Published in 2017 at "Journal of Nanophotonics"
DOI: 10.1117/1.jnp.11.032509
Abstract: Abstract. The development of methods for in situ analysis is required to provide deeper understanding of carbon film materials formation during chemical vapor deposition (CVD). Here, we describe scanning probe microscope instrument designed for study… read more here.
Keywords: chemical vapor; carbon; scanning probe; microscope ... See more keywords