Sample Thickness Limitations in Defocused Electron Probe Ptychography
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DOI: 10.1017/s1431927618001435
Abstract: Defocused probe ptychography aims to determine the amplitude and phase shift that a sample object imparts upon an impinging electron beam, using an algorithm that converges modelled and experimentally determined diffraction patterns arising from illuminating… read more here.
Keywords: sample; microscopy; probe ptychography; sample thickness ... See more keywords