Influence of Microwave Probes on Calibrated On-Wafer Measurements
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DOI: 10.1109/tmtt.2019.2903400
Abstract: On-wafer probing with ground–signal–ground (GSG) probes contributes a variety of side effects, which are related to the measured line type, the carrier material, the layout with the neighboring structures, and the probe. Thus, the size… read more here.
Keywords: influence; wafer; influence microwave; probes calibrated ... See more keywords