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Published in 2018 at "International Journal of Electronics"
DOI: 10.1080/00207217.2017.1357204
Abstract: ABSTRACT A low-voltage feedforward ring voltage-controlled oscillator (FRVCO) withstanding process variation and supply-voltage noise is proposed in this paper. In this design, the variation of transistors’ threshold voltages and supply voltage noise are detected by…
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Keywords:
process variation;
voltage;
variation;
variation supply ... See more keywords
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1
Published in 2018 at "IEEE Transactions on Computers"
DOI: 10.1109/tc.2018.2789904
Abstract: Graphics Processing Units (GPUs) have been employed in embedded systems to handle increased amounts of computation and to satisfy the timing requirement. Due to the small feature size, chip aging and within-die parameter variations have…
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Keywords:
technique;
variation;
aware workload;
management ... See more keywords
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1
Published in 2022 at "IEEE Transactions on Computers"
DOI: 10.1109/tc.2022.3141841
Abstract: Aggressive scaling in integrated circuits creates new challenges such as an increase in power density, temperature, and especially process variation in designing Multiprocessor Systems-on-Chip (MPSoC). While most of the previous works attempt to mitigate the…
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Keywords:
stochastic decomposition;
time;
process variation;
variation ... See more keywords
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Published in 2021 at "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"
DOI: 10.1109/tcad.2020.3023684
Abstract: In this study, a novel method for the detection of recycled field-programmable gate arrays (FPGAs) is proposed. This method is based on with-in die (WID) process variation model over an exhaustive path characterization [referred to…
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Keywords:
detection;
variation;
wid process;
recycled fpga ... See more keywords
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Published in 2022 at "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"
DOI: 10.1109/tcad.2021.3091957
Abstract: Three-dimensional (3D) flash memory is an emerging memory technology that enables a number of improvements to conventional planar NAND flash memory, including larger capacity, less program disturb, and lower access latency. Despite these advantages, 3D…
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Keywords:
memory;
space;
flash memory;
process variation ... See more keywords
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1
Published in 2018 at "IEEE Transactions on Very Large Scale Integration (VLSI) Systems"
DOI: 10.1109/tvlsi.2018.2831665
Abstract: Near-threshold computing (NTC) has the potential to significantly improve efficiency in high throughput architectures, such as general-purpose computing on graphic processing unit (GPGPU). Nevertheless, NTC is more sensitive to process variation (PV) as it complicates…
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Keywords:
process variation;
tex math;
voltage stacking;
inline formula ... See more keywords
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1
Published in 2022 at "Clinical medicine"
DOI: 10.7861/clinmed.22-4-s82
Abstract: Baseline data from October 2019 to July 2020 were reviewed. Patients who had a delay of > 60 minutes in antibiotic administration were chosen to understand the causes of process variation. The data reviewed revealed…
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Keywords:
time;
tta paediatric;
process variation;
antibiotics tta ... See more keywords