LAUSR

About LAUSR
Donate
Contact Us

Follow us:

You are not signed in:

Sign Up!


   Articles with "process variation" as a keyword



A 0.65-V process variation and supply noise insensitive ring VCO

Sign Up to like & get
recommendations! Published in 2018 at "International Journal of Electronics"

DOI: 10.1080/00207217.2017.1357204

Abstract: ABSTRACT A low-voltage feedforward ring voltage-controlled oscillator (FRVCO) withstanding process variation and supply-voltage noise is proposed in this paper. In this design, the variation of transistors’ threshold voltages and supply voltage noise are detected by… read more here.

Keywords: process variation; voltage; variation; variation supply ... See more keywords

Reliability-Driven HLS Binding: A Simulated Annealing Approach to Minimize Aging and Process Variation in Digital Circuits

Sign Up to like & get
recommendations! Published in 2025 at "IEEE Access"

DOI: 10.1109/access.2025.3600983

Abstract: The aggressive scaling of CMOS technology into the nanoscale regime has driven remarkable performance improvements. However, it has introduced significant reliability challenges due to stochastic aging and process variation (APV) effects, including Bias Temperature Instability… read more here.

Keywords: process variation; aging process; reliability; approach ... See more keywords

Aging-Aware Workload Management on Embedded GPU Under Process Variation

Sign Up to like & get
recommendations! Published in 2018 at "IEEE Transactions on Computers"

DOI: 10.1109/tc.2018.2789904

Abstract: Graphics Processing Units (GPUs) have been employed in embedded systems to handle increased amounts of computation and to satisfy the timing requirement. Due to the small feature size, chip aging and within-die parameter variations have… read more here.

Keywords: technique; variation; aware workload; management ... See more keywords

Stereo: Assignment and Scheduling in MPSoC Under Process Variation by Combining Stochastic and Decomposition Approaches

Sign Up to like & get
recommendations! Published in 2022 at "IEEE Transactions on Computers"

DOI: 10.1109/tc.2022.3141841

Abstract: Aggressive scaling in integrated circuits creates new challenges such as an increase in power density, temperature, and especially process variation in designing Multiprocessor Systems-on-Chip (MPSoC). While most of the previous works attempt to mitigate the… read more here.

Keywords: stochastic decomposition; time; process variation; variation ... See more keywords
Photo from wikipedia

Accurate Recycled FPGA Detection Using an Exhaustive-Fingerprinting Technique Assisted by WID Process Variation Modeling

Sign Up to like & get
recommendations! Published in 2021 at "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"

DOI: 10.1109/tcad.2020.3023684

Abstract: In this study, a novel method for the detection of recycled field-programmable gate arrays (FPGAs) is proposed. This method is based on with-in die (WID) process variation model over an exhaustive path characterization [referred to… read more here.

Keywords: detection; variation; wid process; recycled fpga ... See more keywords

PVSensing: A Process-Variation-Aware Space Allocation Strategy for 3D NAND Flash Memory

Sign Up to like & get
recommendations! Published in 2022 at "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"

DOI: 10.1109/tcad.2021.3091957

Abstract: Three-dimensional (3D) flash memory is an emerging memory technology that enables a number of improvements to conventional planar NAND flash memory, including larger capacity, less program disturb, and lower access latency. Despite these advantages, 3D… read more here.

Keywords: memory; space; flash memory; process variation ... See more keywords

Fast Mask Optimization Under Process Variation Using Guided Local Search on Quadratic Programming

Sign Up to like & get
recommendations! Published in 2025 at "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"

DOI: 10.1109/tcad.2025.3558148

Abstract: In advanced optical lithography, it is critical to obtain a mask with high fidelity to a target pattern and strong tolerance to process variation within a short time. This article formulates the mask optimization problem… read more here.

Keywords: process variation; mask optimization; local search; fidelity ... See more keywords

Process-Variation-Aware In-Memory Computation With Improved Linearity Using On-Chip Configurable Current-Steering Thermometric DAC

Sign Up to like & get
recommendations! Published in 2024 at "IEEE Transactions on Circuits and Systems I: Regular Papers"

DOI: 10.1109/tcsi.2024.3422883

Abstract: The in-memory computation (IMC) is a potential technique to improve the speed and energy efficiency of data-intensive designs. However, the scalability of IMC to large systems is hindered by the non-linearities of analog multiply-and-accumulate (MAC)… read more here.

Keywords: linearity; mac operations; process variation; imc ... See more keywords

GPU NTC Process Variation Compensation With Voltage Stacking

Sign Up to like & get
recommendations! Published in 2018 at "IEEE Transactions on Very Large Scale Integration (VLSI) Systems"

DOI: 10.1109/tvlsi.2018.2831665

Abstract: Near-threshold computing (NTC) has the potential to significantly improve efficiency in high throughput architectures, such as general-purpose computing on graphic processing unit (GPGPU). Nevertheless, NTC is more sensitive to process variation (PV) as it complicates… read more here.

Keywords: process variation; tex math; voltage stacking; inline formula ... See more keywords

Study of Process Variation in Nanotube Tunnel Field Effect Transistor

Sign Up to like & get
recommendations! Published in 2024 at "ECS Journal of Solid State Science and Technology"

DOI: 10.1149/2162-8777/ad5c9d

Abstract: In the nanoscale, the process parameters and device dimension variation extensively affect the electrical performance of the device. Therefore, an inclusive study for the prediction of the overall device behavior is extremely necessary. In this… read more here.

Keywords: process variation; process; variation nanotube; variation ... See more keywords

Time to antibiotics (TTA) in paediatric patients with fever in the setting of neutropenia.

Sign Up to like & get
recommendations! Published in 2022 at "Clinical medicine"

DOI: 10.7861/clinmed.22-4-s82

Abstract: Baseline data from October 2019 to July 2020 were reviewed. Patients who had a delay of > 60 minutes in antibiotic administration were chosen to understand the causes of process variation. The data reviewed revealed… read more here.

Keywords: time; tta paediatric; process variation; antibiotics tta ... See more keywords