Articles with "process variation" as a keyword



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A 0.65-V process variation and supply noise insensitive ring VCO

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Published in 2018 at "International Journal of Electronics"

DOI: 10.1080/00207217.2017.1357204

Abstract: ABSTRACT A low-voltage feedforward ring voltage-controlled oscillator (FRVCO) withstanding process variation and supply-voltage noise is proposed in this paper. In this design, the variation of transistors’ threshold voltages and supply voltage noise are detected by… read more here.

Keywords: process variation; voltage; variation; variation supply ... See more keywords
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Aging-Aware Workload Management on Embedded GPU Under Process Variation

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Published in 2018 at "IEEE Transactions on Computers"

DOI: 10.1109/tc.2018.2789904

Abstract: Graphics Processing Units (GPUs) have been employed in embedded systems to handle increased amounts of computation and to satisfy the timing requirement. Due to the small feature size, chip aging and within-die parameter variations have… read more here.

Keywords: technique; variation; aware workload; management ... See more keywords
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Stereo: Assignment and Scheduling in MPSoC Under Process Variation by Combining Stochastic and Decomposition Approaches

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Published in 2022 at "IEEE Transactions on Computers"

DOI: 10.1109/tc.2022.3141841

Abstract: Aggressive scaling in integrated circuits creates new challenges such as an increase in power density, temperature, and especially process variation in designing Multiprocessor Systems-on-Chip (MPSoC). While most of the previous works attempt to mitigate the… read more here.

Keywords: stochastic decomposition; time; process variation; variation ... See more keywords
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Accurate Recycled FPGA Detection Using an Exhaustive-Fingerprinting Technique Assisted by WID Process Variation Modeling

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Published in 2021 at "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"

DOI: 10.1109/tcad.2020.3023684

Abstract: In this study, a novel method for the detection of recycled field-programmable gate arrays (FPGAs) is proposed. This method is based on with-in die (WID) process variation model over an exhaustive path characterization [referred to… read more here.

Keywords: detection; variation; wid process; recycled fpga ... See more keywords
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PVSensing: A Process-Variation-Aware Space Allocation Strategy for 3D NAND Flash Memory

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Published in 2022 at "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"

DOI: 10.1109/tcad.2021.3091957

Abstract: Three-dimensional (3D) flash memory is an emerging memory technology that enables a number of improvements to conventional planar NAND flash memory, including larger capacity, less program disturb, and lower access latency. Despite these advantages, 3D… read more here.

Keywords: memory; space; flash memory; process variation ... See more keywords
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GPU NTC Process Variation Compensation With Voltage Stacking

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Published in 2018 at "IEEE Transactions on Very Large Scale Integration (VLSI) Systems"

DOI: 10.1109/tvlsi.2018.2831665

Abstract: Near-threshold computing (NTC) has the potential to significantly improve efficiency in high throughput architectures, such as general-purpose computing on graphic processing unit (GPGPU). Nevertheless, NTC is more sensitive to process variation (PV) as it complicates… read more here.

Keywords: process variation; tex math; voltage stacking; inline formula ... See more keywords
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Time to antibiotics (TTA) in paediatric patients with fever in the setting of neutropenia.

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Published in 2022 at "Clinical medicine"

DOI: 10.7861/clinmed.22-4-s82

Abstract: Baseline data from October 2019 to July 2020 were reviewed. Patients who had a delay of > 60 minutes in antibiotic administration were chosen to understand the causes of process variation. The data reviewed revealed… read more here.

Keywords: time; tta paediatric; process variation; antibiotics tta ... See more keywords