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Published in 2020 at "Microelectronics Reliability"
DOI: 10.1016/j.microrel.2020.113884
Abstract: Abstract This work analyses the conducted electromagnetic interference (EMI) immunity of the Cortex-M4 processor as function of aging. With this purpose, voltage dips were injected in the VDD input power pins of the processor as…
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Keywords:
conducted emi;
emi susceptibility;
processor function;
function aging ... See more keywords