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Published in 2018 at "Optik"
DOI: 10.1016/j.ijleo.2017.10.038
Abstract: Abstract In this paper, the correlation between wafer quality and cell efficiency was studied to identify the key impact factors, such as effective lifetime, impurities and defects. Standard (STD, 2.94E21atoms/cm 3 ) and lightly doped…
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Keywords:
design control;
cell efficiency;
cell;
production future ... See more keywords