Simulation-based inference of high-field side scrape-off layer filament characteristics using density profile reflectometry
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DOI: 10.1063/5.0298509
Abstract: Simulation-based inference (SBI) is applied to high-field side (HFS) scrape-off layer (SOL) density profile reflectometry measurements on DIII-D, resulting in the inference of filament characteristics and fluctuation magnitudes. The predicted density fluctuation levels are found… read more here.
Keywords: profile reflectometry; filament; density; field side ... See more keywords