The optical properties of transferred graphene and the dielectrics grown on it obtained by ellipsometry
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DOI: 10.1016/j.apsusc.2017.08.109
Abstract: Abstract Graphene layers grown by chemical vapour deposition (CVD) method and transferred from Cu-foils to the oxidized Si-substrates were investigated by spectroscopic ellipsometry (SE), Raman and X-Ray Photoelectron Spectroscopy (XPS) methods. The optical properties of… read more here.
Keywords: ellipsometry; graphene layers; properties transferred; optical properties ... See more keywords