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Published in 2019 at "Microelectronics Reliability"
DOI: 10.1016/j.microrel.2019.113463
Abstract: Abstract This paper discusses the Transmission Line Pulse (TLP) analysis, generally used for electrostatic discharge (ESD) device characterization, as high potential usable tool also for non-ESD structures. TLP technique, combined with DC and pulsed I-V…
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Keywords:
trapping mechanisms;
transmission line;
line pulse;
pulse tlp ... See more keywords