Development of in-situ trap characterisation techniques for EMCCDs
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DOI: 10.1088/1748-0221/13/02/c02025
Abstract: The "trap pumping" technique has seen considerable use over recent years as a means to probe the intrinsic properties of silicon defects that can impact charge transfer performance within CCD-based technologies. While the theory behind… read more here.
Keywords: trap characterisation; trap pumping; pumping technique; situ trap ... See more keywords